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Scanning Electron Microscope

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MOQ : 1 Unit

Scanning Electron Microscope Specification

Spare Parts
Detectors, filaments, apertures, vacuum pumps, specimen holders

Features
High vacuum and low vacuum imaging, real-time 3D surface reconstruction, EDS/EBSD compatibility, user-friendly touchscreen interface

Focus System
Precision motorized with autofocus system

View Head
Trinocular, digital output supported

Theory
Scanning Electron Microscope (SEM) utilizes a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens for imaging and analysis.

Drawtube
Trinocular

Sensor
Digital imaging sensor; compatible with secondary electron and backscatter detectors

Resolution
3 nm at 30 kV

Interface
USB, HDMI, LAN, and VGA

Frame Rate
Up to 60 fps digital video capture

Focal Distance
8 mm to 48 mm (variable, depending on objective)

Magnification
20x - 300,000x (step-less)

Dimensions
600 mm (W) x 850 mm (D) x 1500 mm (H)

Focus Range
5 mm - infinity (automatic and manual modes available)

Eyepieces
Optional, with digital display as standard

Eyepiece Tube
Ergonomic, adjustable inclination

Illumination
Electron beam illumination with variable intensity control

Coarse Adjustment Range
100 mm

Fine Adjustment Range
0.1 mm increments

Working Stage
Motorized XYZ stage, 5-axis (X, Y, Z, rotation, tilt)

Still Image Capture Resolution
up to 4096 x 4096 pixels / 16 MP

Video Capture Resolution
Full HD 1920 x 1080p

Image Format
JPG, TIFF, BMP, PNG, and proprietary RAW SEM formats

Interpupillary Distance
50 ~ 75 mm (adjustable when optical view is configured)

Objective Achromatic
Plan achromatic objectives selectable via motorized turret

Condenser
Electromagnetic condenser lens system with variable aperture

Light Source
Tungsten filament or LaB6; field emission LED options available

Specimen Holder Capacity
Up to 6 standard stubs, multi-sample carousel supported

Environmental Controls
Chamber temperature and humidity monitoring

Stage Movement Range
X, Y: 100 mm; Z: 50 mm; Tilt: -10 to 90; Rotation: 360

Safety Features
Interlocked access doors, overheat and overload protections

Chamber Size
300 mm diameter, with large specimen compatibility

Detector Types
Secondary electron, backscattered electron, and EDS detector ready

Operating Voltage
1 kV to 30 kV, adjustable in 0.1 kV steps

Software Compatibility
Windows 10/11, automated analysis, reporting and data export tools

Emission Source
Tungsten filament (standard); field emission gun (optional)

Power Supply
AC220V 10%, 50/60Hz, 1 kVA

Vacuum System
Oil-free rotary and turbomolecular pumps

Scanning Electron Microscope Trade Information

Minimum Order Quantity
1 Unit

Payment Terms
Cash in Advance (CID)

Supply Ability
15 Units Per Month

Delivery Time
2-10 Days

Main Domestic Market
All India

About Scanning Electron Microscope

The Scanning Electron Microscope-Highly Recommended for advanced imaging-blends phenomenal resolution with venerable reliability. Its glorious 3 nm resolution at 30 kV, versatile emission source options (Tungsten filament or field emission gun), and proprietary digital imaging sensor deliver unmatched clarity. Equipped with a robust, oil-free vacuum system and chamber delivering up to 300 mm diameter compatibility, it handles large specimens effortlessly. Multi-modal detection, advanced specimen handling, environmental controls, and seamless software integration ensure comprehensive analysis. Shop Now to experience scientific excellence and unlock a new standard in microscopic imaging!

Application Media, Competitive Edge & User Base

The Scanning Electron Microscope is invaluable in research labs, industry, material science, biology, and forensic analysis-offering users exceptional imaging and analytical capabilities. Its competitive advantages include phenomenal multi-detector support, high-resolution imaging, and automated analysis tools. Used by top manufacturers, universities, quality assurance teams, and scientific research institutions, it ensures superior insights across application media, giving users a remarkable edge in discovery and innovation.

Domestic Market Reach, Port & Sample Exchange Value

With prompt arrival in the main domestic market across India, this SEM holds outstanding market value for professionals and institutions alike. Shipped from a reputable FOB Port, it comes with sample availability for evaluation and exchange, ensuring user satisfaction and investment confidence. This instrument's capabilities and support structure make it a preferred choice, elevating user experience and strengthening its position in the competitive microscopy market.

FAQ's of Scanning Electron Microscope:

Q: How does the Scanning Electron Microscope achieve such high resolution?

A: The SEM achieves up to 3 nm resolution at 30 kV using a precisely focused beam of high-energy electrons, advanced emission sources, and state-of-the-art digital imaging sensors. Its multi-detector arrangement enhances imaging clarity and detail for various specimen types.

Q: What advantages does this SEM offer compared to traditional light microscopes?

A: This SEM allows for magnifications up to 300,000x with superior depth of field, providing highly detailed, three-dimensional surface information, which is far beyond the capabilities of traditional optical technologies.

Q: Where can I use this SEM and who typically benefits from it?

A: This SEM is widely used across universities, research centers, manufacturing quality control, materials science, biology, and forensic analysis, benefiting scientists, engineers, and lab professionals seeking in-depth specimen analysis.

Q: What is the process for specimen preparation and imaging?

A: Specimens are mounted on compatible stubs, placed in the spacious chamber, and imaged under vacuum, using adjustable emission voltage and multi-axis motorized staging for precise observation. Automated software aids in capturing and analyzing images efficiently.

Q: Is a sample unit available for evaluation before purchase?

A: Yes, sample units are available for assessment upon request, allowing potential users to evaluate features and performance, ensuring it fits application requirements before committing to full-scale acquisition.

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