Stationary XRF Spectrometers

• Equipment Type
• High-end EDXRF Spectrometer

• Accuracy
• Element-dependent (typically better than 0.1% for major elements)

• Application
• Elemental analysis for solids, liquids, powders, and thin films

• Automation Grade
• Optional automation with integrated sample changer

• Capacity
• Automated sample changer: up to 12 samples

• Control Mode
• PC-controlled via Bruker SPECTRA.ELEMENTS Software

• Display Type
• Digital display via external PC monitor

• Features
• Small spot analysis, mapping, vacuum and air atmosphere, TouchControl, large sample chamber

• Frequency
• 50/60 Hz

• Gas Pressure
• Helium purge up to 1 bar (for light element analysis)

• Humidity
• 20-80% non-condensing

• Interface Type
• Ethernet, USB, HDMI

• Machine Weight
• 68 kg (approx.)

• Max Height
• Sample chamber height up to ~50 mm

• Measuring Range
• Sealed proportional counter: 1 to 40 keV, Silicon Drift Detector (SDD): up to 40 keV

• Mounting Type
• Benchtop

• Number of Specimens
• Single or automatic changer up to 12 samples

• Operating Voltage
• Up to 50 kV x-ray tube

• Port Size
• 32 mm or 40 mm sample tray option

• Power Supply
• 100-240 V AC, 50/60 Hz, 600 VA max

• Resolution
• <136 eV at Mn K (SDD)

• Response Time
• Real-time data acquisition (seconds to minutes per sample)

• Specimen Size
• Supports a range of sample cups and pellet diameters; max 51 mm

• Temperature
• 15C to 30C (operation)

• Test Range
• Elemental range Na (Z=11) to U (Z=92)

• Test Speed
• Programmable, up to 300 tests/hour depending on setup

• Test Stroke
• Not applicable (XRF - non-contact)

• Test Width
• Up to 40 mm for sample chamber opening

• Usage
• Laboratory elemental analysis

• Equipment Type
• XRF Spectrometer

• Accuracy
• High; typical precision <0.05% RSD

• Application
• Elemental analysis in cement, mining, metals, chemicals, and geology

• Automation Grade
• Semi-automatic

• Capacity
• Single or multiple sample loading

• Control Mode
• Automatic and Manual

• Display Type
• Integrated Digital Display

• Features
• Compact, low-power, no water cooling, intuitive software interface, sealed sample chamber

• Frequency
• 50/60 Hz

• Gas Pressure
• No external gas required (air-cooled)

• Humidity
• 20 - 80% RH, non-condensing

• Interface Type
• USB, Ethernet

• Machine Weight
• 45 kg

• Max Height
• 125 mm (instrument)

• Measuring Range
• ppm to 100%

• Mounting Type
• Benchtop

• Number of Specimens
• Multiple, batch mode capable

• Operating Voltage
• 100-240 V AC

• Port Size
• Standard XRF Port

• Power Supply
• 100-240 V, 50/60 Hz

• Resolution
• 160 eV at Mn K

• Response Time
• Results in minutes

• Specimen Size
• Up to 40 mm diameter

• Temperature
• 15C to 35C

• Test Range
• Na (Sodium) to U (Uranium)

• Test Speed
• Up to 200 tests/hour

• Test Stroke
• Adjustable

• Test Width
• Up to 40 mm sample size

• Usage
• Routine elemental analysis, quality control